Memory device test solution | ATE Service English

01/13/201710/09/2021Cloud Testing Service solution, Memory device test solution, Product, Solution, Tester Interface products

Desktop type DUT heating / cooling system

This system is desktop type DUT heating / cooling system using skeleton […]

01/12/201710/09/2021High speed digital measurement, SI/PI, Memory device test solution, Product, Solution

DDRx memory measurement interposer

NEXUS Technology’s component interposer is based on an oscilloscopeProvide the optimum physical […]

01/09/201710/09/2021Cloud Testing Service solution, Memory device test solution, Solution

Cloud Testing Service solution

We have been providing various application services for CX1000 users made by […]

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