Quantix PAT-Man™ is a comprehensive solution for PAT (Part Average Testing ) and other DPM reduction techniques that manages the entire outlier removal process from initial wafer lot characterization to final-test yield monitoring. PAT-Man is used in production by major IDMs around the world to help improve the quality of devices used in safety-critical applications such as automotive, medical and defense.
With PAT-Man’s intelligent, auto-adaptive outlier algorithms and detailed outlier analysis, cost-conscious manufacturers are not only able to minimize PAT yield loss, but often can actually improve yields by using outlier data to better control the manufacturing process.
Features
Supports DPAT, Multi-variate PAT, GDBN, NNR, Cluster, Reticle Step and other outlier detection techniques
Fast recipe creation and yield estimation
Intelligent, auto-adaptive rules for lowest yield impact
PAT yield monitoring and reporting drives yield improvement programs
Integrates easily with manufacturing process at wafer sort or final test
Benefits
Significantly reduces quality and reliability issues and their consequences (e.g. customer returns, product recalls)
Quickly identifies process shifts
Provides a means to communicate rapid feedback amongst the members of the supply chain
Improves your processes, which can lead to actual yield increase
