Powerful Low-Cost Vector Translation Software for the Windows Operating System

By web_masterCloud Testing Service solution, LSI testing solution, Product, Solution

TestDeveloper(TD)

TestDeveloper (TD) is TSSI's powerful vector translation technology offered on the Microsoft Windows platform. TD can be activated as a TD-SCAN or a TD-SIM package via a license file. These are the two packages in the TD product line developed for ATE partners with test solutions for Analog, Mixed Signals, RF, automotive and various life science applications.

The difference between TD-SCAN and TD-SIM is in the type of patterns they support. TD-SCAN supports only scan patterns (WGL and STIL) while TD-SIM supports both scan and functional patterns (VCD, EVCD) where cyclization is required.

TD-SCAN and TD-SIM share the following major common features.

Easy-to-Use Interface - GUI or Batch

Using graphical user interface (GUI) or batch mode to get the job done quickly, TD-Sim and TD-Scan provide an easy-to-use, fill-in-the-blank form to import and generate target tester's output quickly.  No manual or instructions needed for new/casual users.

Advanced/heavy users can use batch mode to queue numerous conversion processes.

Save Time with Intermediate Database & Waveform Viewer

TD-Sim and TD-Scan translate EDA files into an intermediate database. Any subsequent data analysis and adjustment can be done directly to the database using the waveform viewer. Then, when ready, a TesterBridge for a target ATE (such as Chroma or NI) can be invoked to generate tester-ready patterns. For large patterns, this will save many conversion hours.。

Pin Mapping with Signal Table

TD-Sim and TD-Scan Signal Table enables familiar spreadsheet format for pin mapping and a wide variety of operations on signals such as: synthetic signal derivation, setting of levels, ATE specific pin modes, pin groups, and import/export.

TD-Scan for NI LabVIEW

TD-Scan for NI (National Instruments) is a result of the collaboration between TSSI and National Instruments to enable semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems.

TD-Scan for NI produces LabVIEW data so that engineers can read and manipulate WGL and STIL vectors in labVIEW graphical system design software and the NI Digital Waveform Editor, both of which provide control for all the following NI instruments:

 

Key Capabilities

  • Reads WGL and STIL scan patterns generated by ATPG tools (For reading VCD/EVCD, see TD-SIM for NI)
  • Facilitates high-speed ATE programming for National Instrument's High Speed Digital I/O Series listed above
  • Provides powerful waveform viewer and intuitive graphical interface for interactive editing
  • Supports either GUI or Batch operation
  • Works with National Instrument's LabVIEW graphical system design environment
  • Supports auto-detect and adjustable Sample Clock Rate to optimize waveform accuracy vs channel memory
  • Checks for maximum clock rate and edge delays across slots automatically
  • Assigns device channel with customizable system board layout automatically based on customer configuration

 

  • PXI/PCI-6541/6542
  • PXI/PCI-6544/6545
  • PXI/PCI-6547/6548
  • PXI/PCI-6551/6552
  • PXI/PCI-6561/6562
  • PXIe-6555/6556
  • NI STS

NI, LabVIEW, PXI / PCI-65XX are registered trademarks of National Instruments Corporation

WGL-to-STILWriter for Advantest Cloud Testing Service

WGL-to-STILWriter is a Windows-based standalone TD-Scan module made available to work with the Advantest Cloud Testing Service (CTS).

WGL-to-STILWriter converts WGL (TSSI Waveform Generation Language) to STIL (IEEE Standard Test Interface Language 1450-1999).

 

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